Dr Aimo Winkelmann
Visiting Professor
Physics
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Publications
- Strain and luminescence properties of hexagonal hillocks in N-polar GaN
- Bruckbauer Jochen, Cios Grzegorz, Sarua Andrei, Feng Peng, Wang Tao, Hourahine Ben, Winkelmann Aimo, Trager-Cowan Carol, Martin Robert
- Journal of Applied Physics Vol 137 (2025)
- https://doi.org/10.1063/5.0259840
- Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction
- Waters Dale M, Thompson Bethany, Ferenczi Gergely, Hourahine Ben, Cios Grzegorz, Winkelmann Aimo, Stark Christoph J M, Wetzel Christian, Trager-Cowan Carol, Bruckbauer Jochen
- Journal of Applied Physics Vol 137 (2025)
- https://doi.org/10.1063/5.0244438
- Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction
- Hiller Kieran P, Winkelmann Aimo, Hourahine Ben, Starosta Bohdan, Alasmari Aeshah, Feng Peng, Wang Tao, Parbrook Peter J, Zubialevich Vitaly Z, Hagedorn Sylvia, Walde Sebastian, Weyers Markus, Coulon Pierre-Marie, Shields Philip A, Bruckbauer Jochen, Trager-Cowan Carol
- Microscopy and Microanalysis Vol 29, pp. 1879-1888 (2023)
- https://doi.org/10.1093/micmic/ozad118
- Kikuchi pattern simulations of backscattered and transmitted electrons
- Winkelmann Aimo, Nolze Gert, Cios Grzegorz, Tokarski Tomasz, Bała Piotr, Hourahine Ben, Trager‐Cowan Carol
- Journal of Microscopy Vol 284, pp. 157-184 (2021)
- https://doi.org/10.1111/jmi.13051
- Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns
- Nolze Gert, Tokarski Tomasz, Rychłowski Łukasz, Cios Grzegorz, Winkelmann Aimo
- Journal of Applied Crystallography Vol 54, pp. 1012-1022 (2021)
- https://doi.org/10.1107/S1600576721004210
- Tetragonality mapping of martensite in a high-carbon steel by EBSD
- Nolze Gert, Winkelmann Aimo, Cios Grzegorz, Tokarski Tomasz
- Materials Characterization Vol 175 (2021)
- https://doi.org/10.1016/j.matchar.2021.111040
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Professional Activities
- Plenary talk: XVIIIth International Conference on Electron Microscopy, Zakopane, Poland, June 2024. Pushing the Limits of Diffraction Imaging in the Scanning Electron microscope for the Structural Characterisation of Semiconductor thin Films and Microstructures
- Contributor
- 10/6/2024
- Invited Talk: Materials Research Society Fall Meeting, US, December 2023. Title: Pushing the Limits of Diffraction Imaging in the Scanning Electron Microscope for the Structural Characterisation of Semiconductor Thin Films and Microstructures
- Contributor
- 1/12/2023
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Contact
Dr
Aimo
Winkelmann
Visiting Professor
Physics
Email: aimo.winkelmann@strath.ac.uk
Tel: Unlisted